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The influence of the DX centre C-V and I-V characteristics of Schottky barriers in n-type AlGaAs

Articolo
Data di Pubblicazione:
1991
Abstract:
Due to the vanishing of both electron emission and capture rates, the DX centre shows a non-equilibrium occupancy at low temperature. It is shown that this effect results in a non-uniform free-electron density profile that can be controlled by biasing the junction during cooling. Preliminary results are reported showing that the I-V characteristics of Schottky barriers on AlGaAs (x=0.25) are affected by the DX centre occupation
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
DX center; AlGaAs; capacitance; current-voltage
Elenco autori:
Gombia, Enos; Mosca, Roberto
Autori di Ateneo:
MOSCA ROBERTO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/188769
Pubblicato in:
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (PRINT)
Journal
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URL

http://iopscience.iop.org/0268-1242/6/10B/006
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