The influence of the DX centre C-V and I-V characteristics of Schottky barriers in n-type AlGaAs
Articolo
Data di Pubblicazione:
1991
Abstract:
Due to the vanishing of both electron emission and capture rates, the DX centre shows a non-equilibrium occupancy at low temperature. It is shown that this effect results in a non-uniform free-electron density profile that can be controlled by biasing the junction during cooling. Preliminary results are reported showing that the I-V characteristics of Schottky barriers on AlGaAs (x=0.25) are affected by the DX centre occupation
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
DX center; AlGaAs; capacitance; current-voltage
Elenco autori:
Gombia, Enos; Mosca, Roberto
Link alla scheda completa:
Pubblicato in: