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Investigations on the nanostructures of GaN, InN and InxGa1-xN

Academic Article
Publication Date:
2016
abstract:
A controllable approach to the formation of III- nitride nanocrystalline structures using hydrothermal assisted method is presented. The structural and morphological properties of the prepared nanostructures are analyzed using X-ray diffraction, Fast Fourier Transformation and transmission electron microscope techniques. The temperature dependent structural formation of nitride nanostructures have been systematically investigated using X-ray diffraction. Raman spectra of the samples grown at optimized condition exhibited different phonon modes of the respective nitrides (GaN, InN and InxGa1-xN). Nanoparticles and nanorods formation of the indium nitride and indium gallium nitride are observed in the TEM micrographs. FFT analysis revealed that the synthesized III-nitride nanostructures are of good crystalline quality. Nanorods of these nitrides showed better crystalline quality than the nanoparticles in the FFT reflections. (C) 2016 Elsevier Ltd. All rights reserved.
Iris type:
01.01 Articolo in rivista
Keywords:
III-Nitrides; Hydrothermal method; X-ray diffraction (XRD); High resolution transmission electron microscopy (HR-TEM)
List of contributors:
Nasi, Lucia
Authors of the University:
NASI LUCIA
Handle:
https://iris.cnr.it/handle/20.500.14243/403241
Published in:
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Journal
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URL

https://www.sciencedirect.com/science/article/abs/pii/S1369800116300932
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