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Investigations on the nanostructures of GaN, InN and InxGa1-xN

Articolo
Data di Pubblicazione:
2016
Abstract:
A controllable approach to the formation of III- nitride nanocrystalline structures using hydrothermal assisted method is presented. The structural and morphological properties of the prepared nanostructures are analyzed using X-ray diffraction, Fast Fourier Transformation and transmission electron microscope techniques. The temperature dependent structural formation of nitride nanostructures have been systematically investigated using X-ray diffraction. Raman spectra of the samples grown at optimized condition exhibited different phonon modes of the respective nitrides (GaN, InN and InxGa1-xN). Nanoparticles and nanorods formation of the indium nitride and indium gallium nitride are observed in the TEM micrographs. FFT analysis revealed that the synthesized III-nitride nanostructures are of good crystalline quality. Nanorods of these nitrides showed better crystalline quality than the nanoparticles in the FFT reflections. (C) 2016 Elsevier Ltd. All rights reserved.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
III-Nitrides; Hydrothermal method; X-ray diffraction (XRD); High resolution transmission electron microscopy (HR-TEM)
Elenco autori:
Nasi, Lucia
Autori di Ateneo:
NASI LUCIA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/403241
Pubblicato in:
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Journal
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URL

https://www.sciencedirect.com/science/article/abs/pii/S1369800116300932
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