Optical characterization of radiative deep centres in 6H-SiC junction field effect transistors

Academic Article

Publication Date:

2004

Iris type:

01.01 Articolo in rivista

List of contributors:

Pavesi, Maura; Armani, Nicola; Salviati, Giancarlo

Handle:

https://iris.cnr.it/handle/20.500.14243/53599

Published in:

SEMICONDUCTOR SCIENCE AND TECHNOLOGY (PRINT)

Journal