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  1. Outputs

IEEE ELECTRON DEVICE LETTERS (PRINT)

Journal
Identifier:
E079839
ISSN:
0741-3106
  • Overview

Overview

Outputs (41)

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14.8-MeV Neutron Irradiation on H-Terminated Diamond-Based MESFETs
Academic Article
A CMOS, fully integrated sensor for electronic detection of DNA hybridization
Academic Article
A CMOS, fully integrated sensor for electronic detection of DNA hybridization
Academic Article
A narrow-line-width Josephson oscillator for the millimeter-wave region
Academic Article
A reliable technique for experimental evaluation of crystallization activation energy in PCMs
Academic Article
A temperature transducer based on a low-voltage organic thin-film transistor detecting pyroelectric effect
Academic Article
Al+ Implanted 4H-SiC p(+)-i-n Diodes: Forward Current Negative Temperature Coefficient
Academic Article
An AlGaAs-GaAs-based RCE MSM photodetector with delta modulation doping
Academic Article
Analysis of Self-Heating-Related Instability in Self-Aligned p-Channel Polycrystalline-Silicon Thin-Film Transistors
Academic Article
Analysis of phase distribution in phase-change non-volatile memories
Academic Article
Crosstalk characterization in Geiger-mode avalanche photodiode arrays
Academic Article
Diamond Detectors for UV and X-ray Source Imaging
Academic Article
Edge Effects in Self-Heating-Related Instabilities in p-Channel Polycrystalline-Silicon Thin-Film Transistors
Academic Article
Effect of floating-gate polysilicon depletion on the erase efficiency of NAND Flash memories
Academic Article
Electronic switching effect and phase-change transition in chalcogenide materials
Academic Article
Equivalent cell approach for extraction of the SILC distribution in Flash EEPROM cells
Academic Article
Evidence of Correlated Mobility Fluctuations in p-type Organic Thin Film Transistors
Academic Article
Experimental study of data retention in nitride memories by temperature and field acceleration
Academic Article
Extraction of Defects Properties in Dielectric Materials From I-V Curve Hysteresis
Academic Article
Impact of control-gate and floating-gate design on the electron-injection spread of decananometer NAND Flash memories
Academic Article
Impact of electrode materials on resistive-switching memory programming
Academic Article
Impact of neutral threshold-voltage spread and electron-emission statistics on data retention of nanoscale NAND Flash
Academic Article
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors
Academic Article
Investigation of the electron-injection spread in barrier-engineered NAND Flash memories
Academic Article
On the Crossing-Point of 4H-SiC Power Diodes Characteristics
Academic Article
On the correlation between surface roughness and inversion layer mobility in Si-MOSFETs
Academic Article
Optically modulated high-sensitivity heterostructure varactor
Academic Article
Optimization Metrics for Phase Change Memory (PCM) Cell Architectures
Academic Article
Parasitic reset in the programming transient of PCMs
Academic Article
Random telegraph noise effect on the programmed threshold-voltage distribution of Flash memories
Academic Article
Reset Instability in Pulsed-Operated Unipolar Resistive-Switching Random Access Memory Devices
Academic Article
Role of fron contact work function on amorphous silicon/crystalline silicon heterojunction solar cell performance
Academic Article
Simulation of Graphene Nanoribbon Field-Effect Transistors
Academic Article
Stability of H-Terminated Diamond MOSFETs With V2O5/Al2O3 as Gate Insulator
Academic Article
Strain Sensitivity and Transport Properties in Organic Field-Effect Transistors
Academic Article
Stress-induced local trap levels in Au/n-GaAs Schottky diodes with embedded InAs quantum dots
Academic Article
The Transverse Field Detector (TFD): a novel color sensitive CMOS device
Academic Article
The impact of gate-oxide breakdown on SRAM stability
Academic Article
Very Fast and Priming-less Single-Crystal Diamond X-ray Dosimeters
Academic Article
Voltage dependence of hard breakdown growth and the reliability implication in thin devices
Academic Article
Voltage-controlled relaxation oscillations in phase-change memory devices
Academic Article
No Results Found
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