Data di Pubblicazione:
1992
Abstract:
Electrodeposited arsenic and As-Sb alloys were indium plated and the two-layer samples thus
obtained thermally annealed to yield InAs and InAs_,Sb, thin films. The ternary compounds
consisted of two phases, the lattice parameters of which were determined by X-ray diffraction analysis.
Two deposition sequences were also tested as possible routes to GaAs, but neither was successful,
although some GaAs was detected after annealing a two-layer sample obtained by depositing gallium
onto nickel and arsenic onto gallium.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
THIN-FILMS
Elenco autori:
Musiani, Marco
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