Data di Pubblicazione:
2011
Abstract:
We addressed the issue of bismuth heteroantisite defects (BiGa) in GaAs1-xBix/GaAs epilayers by coupling x-ray absorption spectroscopy at the bismuth edge with density functional theory calculations of the defect structure. Calculations predict a large relaxation of the Bi-As interatomic distances when Bi atoms substitute Ga, however we found no experimental evidence of it. Quantitative analysis of the x-ray absorption spectra allows us to establish a maximum concentration limit for Bi_Ga, which corresponds to about 5% of the total Bi atoms. Bi_Ga do not account for the modifications in the spectra previously attributed to short range ordering.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Defects; Semiconductors; Density Functional Theory; X-RAY-ABSORPTION
Elenco autori:
AMORE BONAPASTA, Aldo; Alippi, Paola
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