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Growth, morphological and structural characterization of Pb1-xSnxTe single crystals

Articolo
Data di Pubblicazione:
1991
Abstract:
Pb1-xSnxTe single crystals have been grown by a vertical Bridgman method. They have typical Hall mobilities and carrier concentration values of 103 cm2/V ยท s and 1018 cm-3, respectively, and change from p- to n-type as the Sn content increases. The ingots were single crystal with a subgrain structure that has a misorientation no higher than 2?. The segregation of Sn has been determined and it suggests that there is a convective flow in the liquid.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Leccabue, Fabrizio; Watts, BERNARD ENRICO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/118868
Pubblicato in:
JOURNAL OF CRYSTAL GROWTH
Journal
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