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Phase retrieval of an electron vortex beam using diffraction holography

Articolo
Data di Pubblicazione:
2017
Abstract:
In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a result of constraints in the lens setup, it is particularly difficult to retrieve the phase of a diffraction image. Here, we use a "defocused beam" generated by a nanofabricated hologram to form a reference wave that can be interfered with a diffracted beam. This setup provides an extended interference region with the sample wavefunction in the Fraunhofer plane. As a case study, we retrieve the phase of an electron vortex beam. Beyond this specific example, the approach can be used to retrieve the wavefronts of diffracted beams from a wide range of samples.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Holography; Crystallography; Three dimensional image processing; Nanofabrication; Electron microscopy
Elenco autori:
Frabboni, Stefano; Campanini, Marco; Venturi, Federico; Balboni, Roberto; Grillo, Vincenzo; Gazzadi, Giancarlo
Autori di Ateneo:
BALBONI ROBERTO
GAZZADI GIANCARLO
GRILLO VINCENZO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/371373
Pubblicato in:
APPLIED PHYSICS LETTERS
Journal
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URL

https://aip.scitation.org/doi/10.1063/1.4998595
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