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M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications

Articolo
Data di Pubblicazione:
2013
Abstract:
Irradiation with N+ ions of the 1.5-3.5 MeV energy range was applied to optical waveguide formation. Planar and channel waveguides have been fabricated in an Er-doped tungsten-tellurite glass, and in both types of bismuth germanate (BGO) crystals: Bi4Ge3O12 (eulytine) and Bi12GeO20 (sillenite). Multi-wavelength m-line spectroscopy and spectroscopic ellipsometry were used for the characterisation of the ion beam irradiated waveguides. Planar waveguides fabricated in the Er-doped tungsten-tellurite glass using irradiation with N+ ions at 3.5 MeV worked even at the 1550 nm telecommunication wavelength. 3.5 MeV N + ion irradiated planar waveguides in eulytine-type BGO worked up to 1550 nm and those in sillenite-type BGO worked up to 1330 nm.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Righini, Giancarlo; Pelli, Stefano; NUNZI CONTI, Gualtiero; Berneschi, Simone
Autori di Ateneo:
BERNESCHI SIMONE
NUNZI CONTI GUALTIERO
PELLI STEFANO
RIGHINI GIANCARLO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/254861
Pubblicato in:
THIN SOLID FILMS
Journal
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URL

http://www.sciencedirect.com/science/article/pii/S0040609012016355
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