Data di Pubblicazione:
1994
Abstract:
A numerical analysis founded on the analog circuit model is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the Photothermal Deflection Method. Experimental results are also discussed.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
DE PORTU, Goffredo
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