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Characterization of a Novel Yb:YLF Laser for Optical Frequency Metrology

Contributo in Atti di convegno
Data di Pubblicazione:
2008
Abstract:
In this work a longitudinally pumped, widely tunable, solid state Yb:YLF laser was developed with special design for applications to optical frequency metrology, LIDAR measurements in the atmosphere and for absolute frequency stabilization The YLF crystalline host, combined with efficient diode pumping, allows for wide wavelength tunability at around 1.03 mu m. The novel laser source is being thoroughly characterized in terms of output power, spatial beam quality, single frequency output, and wavelength tunability.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
laser characterization; optical measurements; optical metrology; frequency standard; ND-YAG LASERS; NM
Elenco autori:
Galzerano, Gianluca
Autori di Ateneo:
GALZERANO GIANLUCA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/18320
Titolo del libro:
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
Pubblicato in:
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
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