Structural and analytical characterization of Si1-xGex heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double X-ray diffractometry

Academic Article

Publication Date:

1992

Iris type:

01.01 Articolo in rivista

Keywords:

MOLECULAR-BEAM EPITAXY; MONTE-CARLO SIMULATION; ROCKING-CURVE ANALYSIS; THIN-FILMS; DIFFRACTION

List of contributors:

Authors of the University:

BALBONI ROBERTO

Handle:

Published in:

Journal