Structural and analytical characterization of Si1-xGex heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double X-ray diffractometry

Articolo
Data di Pubblicazione:
1992
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
MOLECULAR-BEAM EPITAXY; MONTE-CARLO SIMULATION; ROCKING-CURVE ANALYSIS; THIN-FILMS; DIFFRACTION
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/17828
Pubblicato in:
MICROSCOPY MICROANALYSIS MICROSTRUCTURES
Journal