CBED STRAIN-MEASUREMENTS IN BORON IMPLANTED SILICON

Academic Article
Publication Date:
1991
Iris type:
01.01 Articolo in rivista
Keywords:
TRANSMISSION ELECTRON-MICROSCOPY; DIFFRACTION; SIMULATION
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/17821
Published in:
MICROSCOPY MICROANALYSIS MICROSTRUCTURES
Journal