Data di Pubblicazione:
2004
Abstract:
We report the fabrication and characterization of high quality tantalum films as absorbers for STJ radiation detectors. Values of the residual resistance ratio up to 75 and bulk value of the superconducting transition temperature T-c = 4.5 +/- 0.1 K have been achieved. Devices for detection with lateral aluminum superconducting tunnel junctions have been fabricated on such films. The detector response to X-ray is discussed. (C) 2003 Elsevier B.V. All rights reserved.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
superconducting tunnel junction detector; epitaxial thin film growing; residual resistance ratio
Elenco autori:
PEREZ DE LARA, David; Lisitskiy, Mikhail; Cristiano, Roberto
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