Three-dimensional silicon-integrated capacitor with unprecedented areal capacitance for on-chip energy storage
Articolo
Data di Pubblicazione:
2020
Abstract:
Here, we leverage the unique atomic layer deposition of conductive (TiN) and dielectric (Al2O3 and HfAlOx) nanocoatings (20 and 40 nm) into trenches etched in silicon with ultra-high aspect-ratio (up to 100) to integrate 3D microcapacitors with areal capacitance up to 1 mu F/mm(2). This sets the new record for silicon capacitors, both integrated and discrete, and paves the way to on-chip energy storage. The 3D microcapacitors feature excellent power and energy densities, namely, 566 W/cm(2) and 1.7 mu Wh/cm(2), respectively, which exceed those of most DCs and SCs. Further, the 3D microcapacitors show excellent stability with voltage (up to 16 V) and temperature (up to 100 degrees C), over 100 h of continuous operation.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
3D microcapacitor; Silicon integrated capacitor; High areal capacitance; High aspect-ratio trench; Atomic layer deposition; Electrochemical etching
Elenco autori:
Barillaro, Giuseppe; Lamperti, Alessio; Strambini, Lucanos
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