Data di Pubblicazione:
2001
Abstract:
The differences in valence band structure and work function between heteroepitaxial nanocrystals and the surrounding substrate were measured with a spectroscopic photoemission and low energy electron microscope which allows laterally resolved photoemission spectroscopy. The nanocrystals were obtained by depositing nominally 2 and 4 monolayers (ML) of InAs on a Se-terminated GaAs(001) surface. The samples showed differences in the valence band edge energy and work function both between nanocrystals and substrate as well as between 2 and 4 ML. We suggest that Se termination of the nanocrystals is the reason for these differences.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
INAS QUANTUM DOTS; SELF-ORGANIZED GROWTH; DECAPPED GAAS(100) SURFACES; ELASTIC STRESS-RELAXATION; IMAGE-CONTRAST; GAAS; SPECTROSCOPY; MICROSCOPY; PHOTOLUMINESCENCE; HETEROSTRUCTURES
Elenco autori:
Heun, Stefan
Link alla scheda completa:
Pubblicato in: