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Wafer-scale VLSI testing

Conference Paper
Publication Date:
2000
abstract:
An abstract is not available.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
Wafer scale integration; Computer-communication networks; VLSI systems; Types and design styles
List of contributors:
Chessa, Stefano; Maestrini, Piero; Caruso, ANTONIO MARIO
Handle:
https://iris.cnr.it/handle/20.500.14243/365657
Full Text:
https://iris.cnr.it//retrieve/handle/20.500.14243/365657/32357/prod_406545-doc_142223.pdf
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