Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches for Space Applications
Chapter
Publication Date:
2007
abstract:
RF MEMS series and shunt switches in coplanar waveguide configuration have been tested to check their reliability in terms of technological yield, neumber of cycles and total time during which they are actuated. Power handling has beeb also considered, up to 5 watt.
Iris type:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
RF MEMS; Reliability; Power Handling
List of contributors:
Catoni, Simone; Marcelli, Romolo
Book title:
Emerging Technologies for RF and Millimeter Waves Circuits