Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches for Space Applications
Capitolo di libro
Data di Pubblicazione:
2007
Abstract:
RF MEMS series and shunt switches in coplanar waveguide configuration have been tested to check their reliability in terms of technological yield, neumber of cycles and total time during which they are actuated. Power handling has beeb also considered, up to 5 watt.
Tipologia CRIS:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
RF MEMS; Reliability; Power Handling
Elenco autori:
Catoni, Simone; Marcelli, Romolo
Link alla scheda completa:
Titolo del libro:
Emerging Technologies for RF and Millimeter Waves Circuits