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Langmuir-Schaefer films of nafion with incorporated TiO2 nanoparticles

Articolo
Data di Pubblicazione:
2005
Abstract:
An easy method of incorporating TiO nanoparticles into Nafion perfluorinated ionomer is proposed. Ultrathin films of Nafion were prepared by employing the Langmuir-Schaefer (LS) technique. The pressure-area isotherm study of a Langmuir monolayer of Nafion at the air-water interface on different concentrations of NaCl as the subphase allowed us to find the best experimental conditions for the deposition of stable Langmuir-Schaefer films. Incorporation of TiO nanoparticles was performed by dipping Nafion LS films in a solution of TiO nanoparticles. The uniformity of the TiO incorporation was detected by UV-visible spectroscopy. The morphology of the Nafion, Nafion/TiO nanoparticles thin films, and the changes due to the annealing procedure were investigated by atomic force microscopy. Interestingly, the AFM investigation showed that Nafion and Nafion/TiO LS films have thermal stability up to 600°C.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Nafion; TiO2; Langmuir-Schaefer; AFM
Elenco autori:
Notargiacomo, Andrea
Autori di Ateneo:
NOTARGIACOMO ANDREA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/364486
Pubblicato in:
LANGMUIR
Journal
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http://www.scopus.com/record/display.url?eid=2-s2.0-11844280316&origin=inward
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