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Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy

Academic Article
Publication Date:
2005
abstract:
Scanning tunneling microscopy (STM) is a powerful technique to map the distribution or the density of electronics states of conductive surfaces with angstrom (A) resolution. STM requires sharp conductive tips in order to operate in ambient conditions. which ore stable with respect to oxidation, We describe a procedure to obtain high quality tips from wires of different materials such as Co and Ni. We discuss in detail the electrochemical process employed in the fabrication of the tips and assess the shape of the tips by optical microscopy and scanning electron microscopy (SEM), These tips yield high-resolution STM images even after a few weeks of exposure to air.
Iris type:
01.01 Articolo in rivista
Keywords:
obalt; nickel; electrochemistry; scanning tunnelling microscopy; scanning electron microscopy
List of contributors:
Biscarini, Fabio; Cavallini, Massimiliano; Albonetti, Cristiano
Authors of the University:
ALBONETTI CRISTIANO
CAVALLINI MASSIMILIANO
Handle:
https://iris.cnr.it/handle/20.500.14243/15232
Published in:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B
Journal
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URL

http://link.aip.org/link/?JVB/23/2564/1
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