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Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy

Articolo
Data di Pubblicazione:
2005
Abstract:
Scanning tunneling microscopy (STM) is a powerful technique to map the distribution or the density of electronics states of conductive surfaces with angstrom (A) resolution. STM requires sharp conductive tips in order to operate in ambient conditions. which ore stable with respect to oxidation, We describe a procedure to obtain high quality tips from wires of different materials such as Co and Ni. We discuss in detail the electrochemical process employed in the fabrication of the tips and assess the shape of the tips by optical microscopy and scanning electron microscopy (SEM), These tips yield high-resolution STM images even after a few weeks of exposure to air.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
obalt; nickel; electrochemistry; scanning tunnelling microscopy; scanning electron microscopy
Elenco autori:
Biscarini, Fabio; Cavallini, Massimiliano; Albonetti, Cristiano
Autori di Ateneo:
ALBONETTI CRISTIANO
CAVALLINI MASSIMILIANO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/15232
Pubblicato in:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B
Journal
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URL

http://link.aip.org/link/?JVB/23/2564/1
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