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THERMAL PROPERTIES MEASUREMENTS OF PHASE-CHANGE ALLOYS WITHIN THE CONFIGURATION OF NANOSTRUCTURES AND DEVICES

Contributo in Atti di convegno
Data di Pubblicazione:
2018
Abstract:
Thermal properties of phase change chalcogenide alloys involved in the phase change memory devices are measured using experimental techniques suitable with the observation scale. The modulated photothermal radiometry, the time resolved pump-probe thermoreflectance and the scanning thermal microscopy are used in a general inverse approach. This note aims to describe the work we have done during the ten last years in terms of experimental techniques and comparison with theoretical models.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
phase-change alloys; memory devices; thermal properties; conduction; microscale; inverse methods
Elenco autori:
Fallica, ROBERTO ALFIO; Longo, Massimo; Wiemer, Claudia
Autori di Ateneo:
LONGO MASSIMO
WIEMER CLAUDIA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/363597
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http://www.ihtcdigitallibrary.com/conferences/ihtc16,701fb4b60463195f,0426c15b39967afd.html?sgstd=1
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