Interface magnetization profiling by x-ray magnetometry of marker impurities on FeGaAs(001)-(4×6)

We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs (001) - (4×6). X-ray magnetic circular dichroism on Co L2,3 edges has been used to perform, in a Mössbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film. © 2005 American Institute of Physics.