A new version of the PIXE-alpha system

In this paper, a new version of the LNS portable PIXE-alpha system is presented. This version allows to perform measurements on small dimension (few millimetres) artefacts. As the previous one, the present system is particularly suited for the elemental characterization of thin layers (2-3 ?m) and is made up by a 1 mCi 210-Po alpha source, coupled to a germanium detector having an energy resolution of 130 eV at 5.9 KeV and a 8 ?m Be window. With this system it is possible to evidence the K-lines of low and medium atomic number elements (from Mg to Zn) and to well separate the L and M-lines of high atomic number elements.