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Step erosion during nucleation of InAs/GaAs(001) quantum dots

Articolo
Data di Pubblicazione:
2005
Abstract:
We have investigated, by means of atomic force microscopy, the complete evolution of InAs/GaAs(001) quantum dots as a function of deposited InAs. Direct evidence is found for step erosion by quantum dots nucleated onto the step edge and an estimate of the eroded volume is provided. By studying the quantum dots volume as a function of InAs coverage, we show that the wetting layer contribution is confined within a narrow range of coverage around the two- and three-dimensional transition.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Quantum dots; Atomic force microscopy (AFM); Nucleation
Elenco autori:
Placidi, Ernesto
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/12921
Pubblicato in:
APPLIED PHYSICS LETTERS
Journal
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URL

http://apl.aip.org/resource/1/applab/v86/i24/p241913_s1
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