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GeV(n) complexes for silicon-based room-temperature single-atom nanoelectronics

Articolo
Data di Pubblicazione:
2018
Abstract:
We propose germanium-vacancy complexes (GeVn) as a viable ingredient to exploit single-atom quantum effects in silicon devices at room temperature. Our predictions, motivated by the high controllability of the location of the defect via accurate single-atom implantation techniques, are based on ab-initio Density Functional Theory calculations within a parameterfree screened-dependent hybrid functional scheme, suitable to provide reliable bandstructure energies and defect-state wavefunctions. The resulting defect-related excited states, at variance with those arising from conventional dopants such as phosphorous, turn out to be deep enough to ensure device operation up to room temperature and exhibit a far more localized wavefunction.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
single atom transistor; point defect; ab initio simulation; germanium vacancy defect
Elenco autori:
Prati, Enrico
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/360456
Pubblicato in:
SCIENTIFIC REPORTS
Journal
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