Data di Pubblicazione:
2000
Abstract:
Thin films of Zr1-xSnxTiO4 (ZTS) were prepared by polymeric precursor route. The influence of process parameters and dopants (Nb, Sb and Ta) on the chemical composition of the films was investigated by means of XPS technique. Surface segregation of Sn-IV and the presence of Sn-0, Ti-II, and Ti-III species in the films were revealed from XPS depth profiles.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Elenco autori:
Kaciulis, Saulius
Link alla scheda completa:
Titolo del libro:
COMMAD 2000 PROCEEDINGS