Data di Pubblicazione:
2010
Abstract:
The reliability of RF MEMS switches is typically reduced by charging effects occurring in the dielectrics. The aim of this paper is to discuss these effects, and to propose analytical and equivalent circuit models which account for most of the physical contributions present in the structure.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Charging effect; Equivalent circuit model; RF-MEMS switches; Models; Electric switches
Elenco autori:
Lucibello, Andrea; DE ANGELIS, Giorgio; Bartolucci, Giancarlo; Proietti, Emanuela; Marcelli, Romolo
Link alla scheda completa:
Pubblicato in: