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Structural and electrical characterization of processable bis-silylated thiophene oligomers

Articolo
Data di Pubblicazione:
1998
Abstract:
A new class of processable, chemically stable, and easily synthesized and purified alpha,omega-bis(dimethyl-tert-butylsilyl) oligothiophenes is described. Information on the solid-state properties was obtained by single crystal X-ray diffraction and CPMAS NMR spectroscopy. Molecular packing was characterized by a sandwich-type organization, with the molecular planes between adjacent layers along the stacking direction being exactly parallel. Vacuum-evaporated thin films of the tetramer, pentamer, and hexamer displayed field effect transistor activity, with charge mobilities increasing with the substrate deposition temperatures in the range 28-80 degrees C. The best FET performance was achieved with the pentamer which was characterized by an on/off ratio > 10(3), reproducibility, and a device stability in air of months.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
FIELD-EFFECT TRANSISTORS; X-RAY STRUCTURE; SOLID-STATE; SUBSTITUTED OLIGOTHIOPHENES; ORGANIC SEMICONDUCTORS
Elenco autori:
Barbarella, Giovanna; Maccagnani, Piera; Ostoja, Paolo
Autori di Ateneo:
MACCAGNANI PIERA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/203743
Pubblicato in:
CHEMISTRY OF MATERIALS
Journal
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