Physical Insight Unveils New Imaging Capabilities of Orthogonality Sampling Method

The orthogonality sampling method (OSM) is a recently introduced qualitative inverse scattering approach for the estimation of the morphological properties of unknown targets. Both the simplicity of implementation and the applicability to various measurement configurations make this method very effective. In this article, a general physical understanding of this otherwise & x201C;pure mathematical & x201D; method is given for the first time. Such an interpretation is derived from the relationship between the currents induced in the investigated scenario and the so-called reduced scattered field, which is the core of the orthogonality sampling indicator function. Interestingly, the nature of such a relationship implies that the reduced scattered field can be related to the radiating component of the induced currents. A direct consequence of such a result is that the OSM is capable of imaging discontinuities within the unknown targets and hence identify regions with different electromagnetic properties. This possibility represents a unique feature among qualitative inverse scattering methods, as these latter have been introduced as tools to image just the external shape of the unknown targets. The new interpretation as well as the above distinctive capability of the OSM are proved with examples on both simulated and experimental data.