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Temperature dependent optical emission efficiency in vacuum sublimed ?-sexithienyl thin films

Articolo
Data di Pubblicazione:
2001
Abstract:
The photoluminescence spectra and quantum yield of ?-sexithienyl (T 6) thin films grown in high vacuum have been measured at different temperatures in the range 30K-300K. The measurements have been performed with a home-built experimental apparatus based on an integrating sphere, which allows luminescence spectra and quantum yield measurements in the temperature range 5K-400K. The analysis of the photoluminescence spectra allows to identify the spectral contribution from molecular ...
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Taliani, Carlo; Muccini, Michele; Murgia, Mauro
Autori di Ateneo:
MUCCINI MICHELE
MURGIA MAURO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/127537
Pubblicato in:
SYNTHETIC METALS
Journal
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