Temperature dependent optical emission efficiency in vacuum sublimed ?-sexithienyl thin films
Articolo
Data di Pubblicazione:
2001
Abstract:
The photoluminescence spectra and quantum yield of ?-sexithienyl (T 6)
thin films grown in high vacuum have been measured at different temperatures in the range
30K-300K. The measurements have been performed with a home-built experimental
apparatus based on an integrating sphere, which allows luminescence spectra and
quantum yield measurements in the temperature range 5K-400K. The analysis of the
photoluminescence spectra allows to identify the spectral contribution from molecular ...
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Taliani, Carlo; Muccini, Michele; Murgia, Mauro
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