Experimental and simulation study of the program efficiency of HfO 2 based charge trapping memories

Conference Paper
Publication Date:
2010
abstract:
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Iris type:
04.01 Contributo in Atti di convegno
Keywords:
charge trapping memories; HfO2; electrical charcaterization; simulation
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/291794