On-wafer experimental characterization for a 4-port circuit, using a two-port Vector Network Analyzer

Conference Paper
Publication Date:
2008
abstract:
The paper presents an experimental method useful to characterize a four-port circuit, using a twoport VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
RF MEMS; on-wafer measurements; four-port devices
List of contributors:
Handle:
https://iris.cnr.it/handle/20.500.14243/70230
Book title:
Proceedings of the International Semiconductor Conference, IEEE CAS 2008