On-wafer experimental characterization for a 4-port circuit, using a two-port Vector Network Analyzer
Contributo in Atti di convegno
Data di Pubblicazione:
2008
Abstract:
The paper presents an experimental method useful to characterize a four-port circuit, using a twoport VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
RF MEMS; on-wafer measurements; four-port devices
Elenco autori:
Bartolucci, Giancarlo; Marcelli, Romolo
Link alla scheda completa:
Titolo del libro:
Proceedings of the International Semiconductor Conference, IEEE CAS 2008