Conductive atomic force microscopy and Scanning impedance microscopy for the imaging of electrical domain in CaCu3Ti4O12 perovskite oxide

Conference Paper

Publication Date:

2010

Iris type:

04.01 Contributo in Atti di convegno

List of contributors:

Fiorenza, Patrick; Raineri, Vito; LO NIGRO, Raffaella

Authors of the University:

FIORENZA PATRICK

LO NIGRO RAFFAELLA

Handle:

https://iris.cnr.it/handle/20.500.14243/70163