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K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability

Academic Article
Publication Date:
2012
abstract:
Shunt capacitive RF MEMS switches were developed on GaAs substrate, using a III-V technology process that is fully compatible with standard MMIC fabrication. The switches show an insertion loss lower than 0.8 dB and isolation better than 30 dB with resonance frequencies in K-band, according to the switch geometric parameters. Reliability limits due to dielectric charging were overcome by applying suitable fast bipolar actuation waveforms, making the developed switches good candidates for both redundancy (always on/off) and cycled applications.
Iris type:
01.01 Articolo in rivista
Keywords:
RF; TEMPERATURE
List of contributors:
Quaranta, Fabio; Persano, Anna; Siciliano, PIETRO ALEARDO
Authors of the University:
PERSANO ANNA
QUARANTA FABIO
SICILIANO PIETRO ALEARDO
Handle:
https://iris.cnr.it/handle/20.500.14243/182885
Published in:
MICROELECTRONICS AND RELIABILITY
Journal
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URL

http://www.sciencedirect.com/science/article/pii/S0026271412001928#
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