Identifier:
E109974
ISSN:
0026-2714
Overview
Outputs (40)
A percolative simulation of dielectric-like breakdown
Academic ArticleAnalysis of the effect of the gate oxide breakdown on SRAM stability
Academic ArticleDependence of post-breakdown conduction on gate oxide thickness
Academic ArticleDistribution and generation of traps in SiO2/Al2O3 gate stacks
Academic ArticleLOCOS induced stress effects on SOI bipolar devices
Academic ArticleProcess dependence of BTI reliability in advanced HK MG stacks
Academic ArticleStructure of the oxide damage under progressive breakdown
Academic ArticleStudy of nanocrystal memory integration in a Flash-like NOR device
Academic ArticleNo Results Found