Data di Pubblicazione:
2003
Abstract:
A strong superlinear dependence of the resonant Rayleigh scattering (RRS) from a semiconductor microcavity (MC) after cw excitation is observed. The effect is associated with transition from normal mode coupling (NMC) to weak coupling regime of the MC modes due to the exciton bleaching. Since the MC-RRS mainly arises from the, scattering of the photonic part of the MC polariton and in NMC regime the RRS is quenched by the excitonic absorption, the loss of exciton oscillator strength produces the strong RRS nonlinearity. (C) 2002 Elsevier Science B.V. All rights reserved.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
semiconductor microcavity; resonant Rayleigh scattering
Elenco autori:
Cavigli, Lucia
Link alla scheda completa:
Pubblicato in: