Data di Pubblicazione:
2010
Abstract:
Atomic force microscopy (AFM) and scanning probe microscopy (SPM) were used to study the surface topography of electrodeposited pure nickel with different grain sizes from ultra-fine to nanoscale level. Such technique, coupled with nanoindentation and nanoscratch experiments allowed to map the nanotribomechanism acting on the same pure metal with different mechanical and topographical properties.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Nanocrystalline materials; AFM; Nanoindentation; Nanoscratch; Wear
Elenco autori:
Prete, Paola
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