Data di Pubblicazione:
2010
Abstract:
In this work we propose an alternative methodology to study B diffusion in crystalline Ge We enhance B diffusion by means of implants in such a way to increase the point-defects distribution through the sample, well above the equilibrium value A comparison between B diffusion Occurring tinder implantation with different ions or after post-implantation annealing allowed to discern any possible role of ionization effects on B diffusion Indeed, B diffusion is demonstrated to Occur through a point-defect-mediated mechanism. The diffusion mechanism is hence discussed These results are a key point for a full comprehension of the B diffusion in Ge.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Bruno, Elena; Priolo, Francesco; Napolitani, Enrico; Impellizzeri, Giuliana; Mirabella, Salvatore
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