Data di Pubblicazione:
2012
Abstract:
We report on triggered single photon emission from GaAs quantum dots, grown on Si substrates
and obtained by means of fabrication protocols compatible with the monolithic integration on Si
based microelectronics. Very bright and sharp individual exciton lines are resolved in the spectra
and can be followed up to 150 K. The nature of quantum emitters of single photon pulses can be
measured up to liquid nitrogen temperature by Hanbury Brown and Twiss interferometric
correlations.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Single Photon; Quantum Dots; Monolithical integration; Si; Quantum Dots
Elenco autori:
Frigeri, Cesare; Cavigli, Lucia
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