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The electronic structure of epsilon-Ga2O3

Articolo
Data di Pubblicazione:
2019
Abstract:
The electronic structure of espilon-Ga2O3 thin films has been investigated by ab initio calculations and photoemission spectroscopy with UV, soft, and hard X-rays to probe the surface and bulk properties. The latter measurements reveal a peculiar satellite structure in the Ga 2p core level spectrum, absent at the surface, and a core-level broadening that can be attributed to photoelectron recoil. The photoemission experiments indicate that the energy separation between the valence band and the Fermi level is about 4.4 eV, a valence band maximum at the ? point and an effective mass of the highest lying bands of - 4.2 free electron masses. The value of the bandgap compares well with that obtained by optical experiments and with that obtained by calculations performed using a hybrid density-functional, which also reproduce well the dispersion and density of states
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Ga2O3; band structure
Elenco autori:
Fiorentini, Vincenzo; Fornari, Roberto; Alippi, Paola; Bosi, Matteo
Autori di Ateneo:
ALIPPI PAOLA
BOSI MATTEO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/344743
Pubblicato in:
APL MATERIALS
Journal
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URL

https://aip.scitation.org/doi/10.1063/1.5054395
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