Data di Pubblicazione:
2008
Abstract:
This paper reviews recent developments in Bayesian software reliability modeling. In so doing, emphasis is given to two models which can incorporate the case of reliability deterioration due to potential introduction of new bugs to the software during the development phase. Since the introduction of bugs is an unobservable process, latent variables are introduced to incorporate this characteristic into the models. The two models are based, respectively, on a hidden Markov model and a self-exciting point process with latent variables. © 2008 The authors and IOS Press. All rights reserved.
Tipologia CRIS:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
Hidden Markov models; Markov chain Monte Carlo; Reliability growth; Self-exciting point process
Elenco autori:
Ruggeri, Fabrizio
Link alla scheda completa: