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Boron Doping of Silicon Using Excimer Lasers

Contributo in Atti di convegno
Data di Pubblicazione:
1988
Abstract:
ABSTRACT ABSTRACTThe use of lasers in the doping of semiconductors has been investigated extensively these last years both for photovoltaic and microelectronic applications. In this work, doping of single-crystal silicon in BCl3 ambients using a pulsed UV laser has been studied as a function of laser wavelength and fluence in order to investigate the effects of photochemical decomposition of the BCl3 gas and the effects of thermal decomposition of adsorbed layers on the doping process. Different parameters involved in the process (laser energy density, number of pulses per frame, BCl3 gas pressure) were investigated. The electrical characteristics of the doped layers were discussed.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
laser doping; silion; boron
Elenco autori:
Nipoti, Roberta
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/217598
Pubblicato in:
MRS PROCEEDINGS
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URL

http://journals.cambridge.org/article_S1946427400474555
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