Optical properties of reactively sputtered TeOx amorphous films

Academic Article
Publication Date:
2005
abstract:
[object Object]
Iris type:
01.01 Articolo in rivista
Keywords:
Integrated optics materials; Ellipsometry and polarimetry; Thin films; optical properties
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/296203
Published in:
APPLIED OPTICS (2004)
Journal