Data di Pubblicazione:
1993
Abstract:
Outstanding stability has been observed in Al/AlxGa1-xAs and Al/GaAs/AlxGa1-xAs (x = 0.25) Schottky barriers prepared by depositing Al in situ by MBE on annealing up to 400-degrees-C. Conventionally evaporated barriers have been fabricated and compared with epitaxial ones. The changes in barrier height and ideality factor induced by annealing are reported
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Schottky barrier devices; Semiconductors
Elenco autori:
Bosacchi, Antonio; Franchi, Secondo; Gombia, Enos; Mosca, Roberto
Link alla scheda completa:
Pubblicato in: