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THERMAL STABILITY OF Al/AlGaAs AND Al/GaAs/AlGaAs(MBE) SCHOTTKY BARRIERS

Articolo
Data di Pubblicazione:
1993
Abstract:
Outstanding stability has been observed in Al/AlxGa1-xAs and Al/GaAs/AlxGa1-xAs (x = 0.25) Schottky barriers prepared by depositing Al in situ by MBE on annealing up to 400-degrees-C. Conventionally evaporated barriers have been fabricated and compared with epitaxial ones. The changes in barrier height and ideality factor induced by annealing are reported
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Schottky barrier devices; Semiconductors
Elenco autori:
Bosacchi, Antonio; Franchi, Secondo; Gombia, Enos; Mosca, Roberto
Autori di Ateneo:
MOSCA ROBERTO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/188802
Pubblicato in:
ELECTRONICS LETTERS
Journal
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http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=209928&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A5445%29
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