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Morphological and optical investigation of lead zirconate titanate (20/80) ultra-thin films

Articolo
Data di Pubblicazione:
2005
Abstract:
Ultra-thin (< 20 nm) lead zirconate-titanate films with Zr/Ti ratio of 20/80 have been deposited on single crystal MgO substrates by sol-gel techniques. Atomic force microscopy reveals a smooth surface consisting of pyramids or domes. The surface morphology is discussed in terms of a double-step growth process: epitaxial growth in the early stages followed by growth on screw dislocations.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
atomic force microscopy; faceting; optical properties; growth mechanisms
Elenco autori:
Leccabue, Fabrizio; Watts, BERNARD ENRICO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/126191
Pubblicato in:
INFORMACIJE MIDEM
Journal
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